Equipment & Infrastructure



TEM – Transmission electron microscopy

Image formation by transmission electron microscopy is based on interaction of a high energy electron beam with a thin sample. Magnifications up to 1.500.000 x possible. OCAS’s TEM is equipped with energy dispersive X-ray analysis. Sample preparation is done by replica extraction or by means of focused ion beam (FIB).

Typical examples of use of TEM include

  • Study of metallographic phases, intermetallic layers
  • Determination of segregation effects at grain bounderies
  • Analysis of nano-particles, such as welding fume dust
  • Study of reaction kinetics of coatings on substrates