At OCAS, two FEG-SEMs are available. Both are equipped with an Electron Back Scatter Diffraction (EBSD) detector and an Energy dispersive X-ray (EDS) spectrometer. A Wavelength dispersive X-ray (WDS) spectrometer is available on only one FEG-SEM. The instruments are therefore applicable for:
- High-magnification observations possible with several different modes as GB (gentle beam), TTL (through the lens), SHL (super hybrid lens), LDF (long depth focus)
- In-depth microstructure characterisation of multi-phase steels
- Orientation imaging by EBSD (electron back scatter diffraction) characterisation
- Prior austenitic microstructure reconstruction
- Element distribution information (EDS as well as WDS) by spot analysis, line scan, X-ray map
- Automated feature analysis by EDS
- Simultaneous EBSD and EDS mappings