Equipment & Infrastructure

SEM (FEG) Field emission gun scanning electron microscope

OCAS’s FEG-SEM is equipped with both an Energy dispersive X-ray (EDS) spectrometer as well as an Wavelength dispersive X-ray (WDS) spectrometer  and an Electron Back Scatter Diffraction (EBSD) detector. The instrument is therefore applicable for:

  • High-magnification observations possible with several different modes as GB (gentle beam), TTL (through the lens), SHL (super hybrid lens), LDF (long depth focus)
  • In-depth microstructure characterisation of multi-phase steels
  • Orientation imaging by EBSD (electron back scatter diffraction) characterisation
  • Prior austenitic microstructure reconstruction
  • Element distribution information (EDS as well as WDS) by spot analysis, line scan, X-ray map