Equipment & Infrastructure

GD-OES Glow discharge optical emission spectrometry

The glow discharge optical emission spectrometry allows for qualitative and semi-quantitative surface analysis of surface and bulk with 2-5 nm depth resolution. Sputtering provides depth profiling of metallic and organic coatings, conversion layers or thin films. 

The technique allows the analysis of conductive as well as non-conductive samples. Spot size varies between 2-4 mm.

OCAS’s GD-OES is equipped with:

  • device to measure tube shaped samples
  • monochromator
  • differential interferometry profiling
  • possibility to analyse deuterium