The glow discharge optical emission spectrometry allows for qualitatieve and semi-quantitative surface analysis with 2-5 nm depth resolution. Sputtering provides depth profiling of metallic and organic coatings, conversion layers or thin films.
The technique allows the analysis of conductive as well as non-conductive samples. Spot size varies between 2-8 mm.
OCAS’s GD-OES is equipped with a device to measure tube shaped samples.