Equipment & Infrastructure

EPMA – Electron probe micro analyser

Scanning electron microscopy provides morphological and elemental information of the surface of a sample. In addition, microprobes have a set of highly sensitive WDX detectors and a highly stable sample stage for element mappings. OCAS’s EPMA has both energy and wavelength dispersive X-ray detection available, enabling nearly unlimited applications.

Typical applications

  • quantitative determination of elemental distribution by spot analysis, line scan or mappings up to 5 cm in length. Especially interesting for segregation studies.
  • study of surface defects
  • characterisation of organic and inorganic coatings
  • study of corroded surfaces